Atomic Force Microscope : NTEGRA platform: NTEGRA Prima

NTEGRA Prima is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy.
The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.*
There are several scanning types implemented in NTEGRA Prima: scanning by the sample, scanning by the probe and dual-scanning. On account of that, the system is ideal for investigating small samples with ultra-high resolution (atomic-molecular level) as well as for big samples and scanning range up to 100x100x10 µm. The unique DualScan TM mode allows investigating even bigger fields on the surface (200×200 µm for X, Y and 22 µm for Z) that can be useful, for example, for living cells and MEMS components… more